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Optical beam induced current measurements: principles and applications to SiC device characterization

Christophe Raynaud; Duy-Minh Nguyen; Nicolas Dheilly; Dominique Tournier; Pierre Brosselard; Mihai Lazar; Dominique Planson

作者Christophe Raynaud; Duy-Minh Nguyen; Nicolas Dheilly; Dominique Tournier; Pierre Brosselard; Mihai Lazar; Dominique Planson
卷第206卷
期第10期
印刷ISSN1862-6319
文件大小1822.76KB
发表时间2009
DOI10.1002/pssa.200825183
页码2273-2283