发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

$Structural Properties of Doped GaN on Si(111) Studied by X-Ray Diffraction Techniques$

Structural Properties of Doped GaN on Si(111) Studied by X-Ray Diffraction Techniques

L. S. Chuah; Z. Hassan; S. S. Ng; H. Abu Hassan

作者L. S. Chuah; Z. Hassan; S. S. Ng; H. Abu Hassan
卷第28卷
印刷ISSN0195-9298
电子ISSN1573-4862
文件大小505.48KB
发表时间2009-12
DOI10.1007/s10921-009-0054-8
页码125-130

← 返回【学霸图书馆】主页