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$Mapping strains at the nanoscale using electron back scatter diffraction$

Mapping strains at the nanoscale using electron back scatter diffraction

Angus J. Wilkinson; Graham Meaden; David J. Dingley

作者Angus J. Wilkinson; Graham Meaden; David J. Dingley
卷第45卷
印刷ISSN0749-6036
电子ISSN1096-3677
文件大小1927.85KB
发表时间2009
DOI10.1016/j.spmi.2008.10.046
页码285-294

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