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Photo-capacitance spectroscopy investigation of deep-level defects in AlGaN/GaN hetero-structures with different current collapses

Photo-capacitance spectroscopy investigation of deep-level defects in AlGaN/GaN hetero-structures with different current collapses

Yoshitaka Nakano; Yoshihiro Irokawa; Yasunobu Sumida; Shuichi Yagi; Hiroji Kawai
  • 作者Yoshitaka Nakano; Yoshihiro Irokawa; Yasunobu Sumida; Shuichi Yagi; Hiroji Kawai
  • 卷第4卷
  • 期第12期
  • 印刷ISSN1862-6254
  • 电子ISSN1862-6270
  • 文件大小510.23KB
  • 发表时间2010
  • DOI10.1002/pssr.201004421
  • 页码374-376
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