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Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy

Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy

Thomas Wermelinger; Flavio C.F. Mornaghini; Christian Hinderling; Ralph Spolenak
  • 作者Thomas Wermelinger; Flavio C.F. Mornaghini; Christian Hinderling; Ralph Spolenak
  • 卷第64卷
  • 期第1期
  • 印刷ISSN0167-577X
  • 文件大小1179.22KB
  • 发表时间2010
  • DOI10.1016/j.matlet.2009.09.061
  • 页码28-30
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