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Use of atomic layer deposition to improve the stability of silver substrates for in situ, high-temperature SERS measurements

Use of atomic layer deposition to improve the stability of silver substrates for in situ, high-temperature SERS measurements

Joshy F. John; Shannon Mahurin; Sheng Dai; Michael J. Sepaniak
  • 作者Joshy F. John; Shannon Mahurin; Sheng Dai; Michael J. Sepaniak
  • 卷第41卷
  • 期第1期
  • 印刷ISSN0377-0486
  • 电子ISSN1097-4555
  • 文件大小2736.71KB
  • 发表时间2010
  • DOI10.1002/jrs.2395
  • 页码4-11
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