[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis
- 作者Illias, Hazlee A.; Chen, George; Lewin, Paul L.
- 文件大小363.53KB
- 发表时间2010
- DOI10.1109/ichve.2010.5640716
- 页码501-504
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