[IEEE 2010 17th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2010) - Athens, Greece (2010.12.12-2010.12.15)] 2010 17th IEEE International Conference on Electronics, Circuits and Systems - DFTT: Design for Trojan Test
Jin, Yier; Kupp, Nathan; Makris, Yiorgos
- 作者Jin, Yier; Kupp, Nathan; Makris, Yiorgos
- 文件大小532.05KB
- 发表时间2010
- DOI10.1109/icecs.2010.5724725
- 页码1168-1171