Effects of gate-bias stress on ZnO thin-film transistors
- 作者Liang-Yu Su; Hsin-Ying Lin; Sung-Li Wang; Yung-Hui Yeh; Chun-Cheng Cheng; Lung Han Peng; Jian-Jang Huang
- 卷第18卷
- 期第10期
- 文件大小239.41KB
- 发表时间2010
- DOI10.1889/jsid18.10.802
Adaptive Bayesian quantum tomographyHuszár, F.; Houlsby, N. M. T. · Physical Review A · 2012
Generalized semiquantum secret-sharing schemesGheorghiu, Vlad · Physical Review A · 2012
Accessible nonlinear entanglement witnessesArrazola, Juan Miguel; Gittsovich, Oleg; Lütkenhaus, Norbert · Physical Review A · 2012
Trirefringence in nonlinear metamaterialsDe Lorenci, Vitorio A.; Pereira, Jonas P. · Physical Review A · 2012
Fourier processing of quantum lightPoem, E.; Gilead, Y.; Lahini, Y.; Silberberg, Y. · Physical Review A · 2012
Heisenberg uncertainty relations for photonsBialynicki-Birula, Iwo; Bialynicka-Birula, Zofia · Physical Review A · 2012
Thermodynamic formalism for dissipative quantum walksGarnerone, Silvano · Physical Review A · 2012
Quantifying nonclassicality with local unitary operationsGharibian, Sevag · Physical Review A · 2012