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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Application of signal and noise theory to digital VLSI testing

[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Application of signal and noise theory to digital VLSI testing

Yogi, Nitin; Agrawal, Vishwani D.

作者Yogi, Nitin; Agrawal, Vishwani D.
文件大小546.22KB
发表时间2010
DOI10.1109/VTS.2010.5469572
页码215-220

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