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Investigation on critical failure thickness of hydrogenated/nonhydrogenated amorphous silicon films

Investigation on critical failure thickness of hydrogenated/nonhydrogenated amorphous silicon films

Kim, Jeehwan; Inns, Daniel; Sadana, Devendra K.
  • 期刊名称Journal of Applied Physics
  • 作者Kim, Jeehwan; Inns, Daniel; Sadana, Devendra K.
  • 卷第107卷
  • 期第7期
  • 印刷ISSN0021-8979
  • 文件大小398.10KB
  • 发表时间2010
  • DOI10.1063/1.3369254
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