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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Investigation of dielectric — Semiconductor interface in MIS structures based on p-Hg<inf>0.8</inf>Cd<inf>0.2</inf>Te

[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Investigation of dielectric — Semiconductor interface in MIS structures based on p-Hg0.8Cd0.2Te

Damnjanovic, V.; Elazar, J. M.

作者Damnjanovic, V.; Elazar, J. M.
文件大小286.38KB
发表时间2010
DOI10.1109/miel.2010.5490515
页码131-133

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