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<![CDATA[Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation]]>

Chen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh

作者Chen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh
卷第31卷
期第12期
文件大小420.45KB
发表时间2010
DOI10.1109/led.2010.2079912

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