[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Design impacts on NAND Flash memory core circuits with vertical MOSFETs
Sakui, Koji; Endoh, Tetsuo
- 作者Sakui, Koji; Endoh, Tetsuo
- 文件大小792.03KB
- 发表时间2010
- DOI10.1109/imw.2010.5488310
- 页码1-4