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Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories

Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories

Suhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan
  • 期刊名称IEEE Electron Device Letters
  • 作者Suhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan
  • 卷第31卷
  • 期第9期
  • 印刷ISSN0741-3106
  • 电子ISSN1558-0563
  • 文件大小434.13KB
  • 发表时间2010-09
  • DOI10.1109/led.2010.2055824
  • 页码936-938
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