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[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Highly-scalable disruptive reading scheme for Gb-scale SPRAM and beyond

[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Highly-scalable disruptive reading scheme for Gb-scale SPRAM and beyond

Takemura, R.; Kawahara, T.; Ono, K.; Miura, K.; Matsuoka, H.; Ohno, H.
  • 作者Takemura, R.; Kawahara, T.; Ono, K.; Miura, K.; Matsuoka, H.; Ohno, H.
  • 文件大小304.49KB
  • 发表时间2010
  • DOI10.1109/imw.2010.5488324
  • 页码1-2
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