[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Statistical Modeling of Image Degradation Based on Quality Metrics
- 作者Chetouani, Aladine; Beghdadi, Azeddine; Deriche, Mohamed
- 文件大小513.15KB
- 发表时间2010
- DOI10.1109/icpr.2010.180
- 页码714-717
The gravimetric determination of germaniumDavies, Glyn Rees; Morgan, Gilbert · The Analyst · 1938
NotesHeadridge, J. B.; Taylor, M. S.; Bloxam, T. W. · The Analyst · 1962
Thermal lens spectrometry. A reviewSnook, Richard D.; Lowe, Roger D. · The Analyst · 1995
Fluorescence spectrometry. A reviewParker, C. A.; Rees, W. T. · The Analyst · 1962
Biochemically functionalized silica nanoparticlesQhobosheane, Monde; Santra, Swadeshmukul; Zhang, Peng; Tan, Weihong · The Analyst · 2001
Printing conducting polymersWeng, B.; Shepherd, R. L.; Crowley, K.; Killard, A. J.; Wallace, G. G. · The Analyst · 2010
A new test for ‘sufficient homogeneity’Fearn, Tom; Thompson, Michael · The Analyst · 2001
Standard additions: myth and realityEllison, Stephen L. R.; Thompson, Michael · The Analyst · 2008