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[IEEE 2010 34th International Electronics Manufacturing Technology Conference (IEMT) - Melaka, Malaysia (2010.11.30-2010.12.2)] 2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT) - Simulation- measurement correlation study of single ended interfaces by using Signal Integrity and Power Integrity co-simulation

[IEEE 2010 34th International Electronics Manufacturing Technology Conference (IEMT) - Melaka, Malaysia (2010.11.30-2010.12.2)] 2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT) - Simulation- measurement correlation study of single ended interfaces by using Signal Integrity and Power Integrity co-simulation

Lim Chin Chuan, ; Wong Tai Loong,

作者Lim Chin Chuan, ; Wong Tai Loong,
文件大小1303.61KB
发表时间2010
DOI10.1109/iemt.2010.5746695
页码1-4

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