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[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - 7.5: Direct IF sampling of TWT AM and PM noise

[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - 7.5: Direct IF sampling of TWT AM and PM noise

Mitsdarffer, K. Bryan; Crespo, William F.; Hoover, Lowell R.

作者Mitsdarffer, K. Bryan; Crespo, William F.; Hoover, Lowell R.
文件大小531.60KB
发表时间2010
DOI10.1109/ivelec.2010.5503587
页码91-92

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