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[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - A robust linear triangle wave generator for ADC testing

[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - A robust linear triangle wave generator for ADC testing

Chun Wei Lin, ; Yi-Cang Wu,

作者Chun Wei Lin, ; Yi-Cang Wu,
文件大小291.54KB
发表时间2010
DOI10.1109/vdat.2010.5496731
页码228-231

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