[IEEE 2010 53rd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Seattle, WA, USA (2010.08.1-2010.08.4)] 2010 53rd IEEE International Midwest Symposium on Circuits and Systems - Circuit simulation for Nano-Electro-Mechanical switches VLSI circuits
- 作者Alzoubi, Khawla; Saab, Daniel G.; Tabib-Azar, Massood
- 文件大小709.18KB
- 发表时间2010
- DOI10.1109/MWSCAS.2010.5548872
- 页码1177-1180
Book Review of Test Theory: A Unified TreatmentReckase, M. D · Applied Psychological Measurement · 2000
Book Review of Test Theory: A Unified Treatment, by R. P. McDonaldBaumgartner, Ted A. · Measurement in Physical Education and Exercise Science · 2000
NEO-FFI scores in college men and women: A view from McDonald’s unified treatment of test theoryGilbert Becker · 2006
Memorial biographyBruce A. Bolt; Dan Loewenthal · 1978
DEVELOPMENT OF A SIBTEST BUNDLE METHODOLOGY FOR IMPROVING TEST EQUITY, WITH APPLICATIONS FOR GRE TEST DEVELOPMENTStout, William; Bolt, Dan; Froelich, Amy Goodwin; Habing, Brian; Hartz, Sarah; Roussos, Louis · ETS Research Report Series · 2003
Ensembl Genomes 2018: an integrated omics infrastructure for non-vertebrate speciesKersey, Paul Julian; Allen, James E; Allot, Alexis; Barba, Matthieu; Boddu, Sanjay; Bolt, Bruce J; Carvalho-Silva, Denise; Christensen, Mikkel; Davis, Paul; Grabmueller, Christoph; Kumar, Navin; Liu, Zicheng; Maurel, Thomas; Moore, Ben; McDowall, Mark D; Maheswari, Uma; Naamati, Guy; Newman, Victoria; Ong, Chuang Kee; Paulini, Michael; Pedro, Helder; Perry, Emily; Russell, Matthew; Sparrow, Helen; Tapanari, Electra; Taylor, Kieron; Vullo, Alessandro; Williams, Gareth; Zadissia, Amonida; Olson, Andrew; Stein, Joshua; Wei, Sharon; Tello-Ruiz, Marcela; Ware, Doreen; Luciani, Aurelien; Potter, Simon; Finn, Robert D; Urban, Martin; Hammond-Kosack, Kim E; Bolser, Dan M; De Silva, Nishadi; Howe, Kevin L; Langridge, Nicholas; Maslen, Gareth; Staines, Daniel Michael; Yates, Andrew · Nucleic Acids Research · 2018
<i>Spitzer</i> Microlensing Parallax for OGLE-2017-BLG-0896 Reveals a Counter-rotating Low-mass Brown DwarfShvartzvald, Yossi; Yee, Jennifer C.; Skowron, Jan; Lee, Chung-Uk; Udalski, Andrzej; Novati, Sebastiano Calchi; Bozza, Valerio; Beichman, Charles A.; Bryden, Geoffery; Carey, Sean; Gaudi, B. Scott; Henderson, Calen B.; Zhu, Wei; Bachelet, Etienne; Bolt, Greg; Christie, Grant; Maoz, Dan; Natusch, Tim; Pogge, Richard W.; Street, Rachel A.; Tan, Thiam-Guan; Tsapras, Yiannis; Pietrukowicz, Paweł; Soszyński, Igor; Szymański, Michał K.; Mróz, Przemek; Poleski, Radoslaw; Kozłowski, Szymon; Ulaczyk, Krzysztof; Pawlak, Michał; Rybicki, Krzysztof A.; Iwanek, Patryk; Albrow, Michael D.; Cha, Sang-Mok; Chung, Sun-Ju; Gould, Andrew; Han, Cheongho; Hwang, Kyu-Ha; Jung, Youn Kil; Kim, Dong-Jin; Kim, Hyoun-Woo; Kim, Seung-Lee; Lee, Dong-Joo; Lee, Yongseok; Park, Byeong-Gon; Ryu, Yoon-Hyun; Shin, In-Gu; Zang, Weicheng; Dominik, Martin; Helling, Christiane; Hundertmark, Markus; Jørgensen, Uffe G.; Longa-Peña, Penelope; Lowry, Stephen; Sajadian, Sedighe; Burgdorf, Martin J.; Campbell-White, Justyn; Ciceri, Simona; Evans, Daniel F.; Fujii, Yuri I.; Hinse, Tobias C.; Rahvar, Sohrab; Rabus, Markus; Skottfelt, Jesper; Snodgrass, Colin; Southworth, John · The Astronomical Journal · 2019
<i>International Journal of Testing</i> 2009 ReviewersInternational Journal of Testing · 2010
Book ReviewGlas, Cees A. W. · International Journal of Testing · 2002
Evaluating Cross-Lingual EquatingRapp, Joel; Allalouf, Avi · International Journal of Testing · 2003
ERRATUMInternational Journal of Testing · 2004
EDITOR'S ACKNOWLEDGMENTSHattie, John A. · International Journal of Testing · 2008
Cheating on TestsMacDonald, Paul L. · International Journal of Testing · 2002
ANNOUNCEMENTInternational Journal of Testing · 2006
Book ReviewAllalouf, Avi · International Journal of Testing · 2005