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[IEEE 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010) - Charleston, SC, USA (2010.10.4-2010.10.7)] 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts - A Study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism: Data and Modeling

[IEEE 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010) - Charleston, SC, USA (2010.10.4-2010.10.7)] 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts - A Study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism: Data and Modeling

Wada, Shin-ichi; Sawa, Koichiro
  • 作者Wada, Shin-ichi; Sawa, Koichiro
  • 文件大小1322.47KB
  • 发表时间2010
  • DOI10.1109/holm.2010.5619520
  • 页码1-8
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