[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - DAta Center Damage Boundaries
Bash, Cullen; Shih, Rocky; Shah, Amip; Patel, Chandrakant
- 作者Bash, Cullen; Shih, Rocky; Shah, Amip; Patel, Chandrakant
- 文件大小808.88KB
- 发表时间2010
- DOI10.1109/itherm.2010.5501417
- 页码1-9