Application of XPS spectral subtraction and multivariate analysis for the characterization of Ar+ ion beam modified polyimide surfaces

• 作者Svitlana Pylypenko; Kateryna Artyushkova; Julia E. Fulghum
• 卷第256卷
• 期第10期
• 印刷ISSN0169-4332
• 文件大小568.83KB
• 发表时间2010
• DOI10.1016/j.apsusc.2009.12.006
• 页码3204-3210