[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Using of AM and FM signal for ADC testing
- 作者Vedral, Josef; Fexa, Pavel; Svatos, Jakub
- 文件大小652.88KB
- 发表时间2010
- DOI10.1109/imtc.2010.5488235
- 页码508-511
Micronewton electromagnetic thrusterCharrier, D. S. H. · Applied Physics Letters · 2012
Electrowetting control of bouncing jetsNoblin, Xavier; Celestini, Franck · Applied Physics Letters · 2012
Microstructural heterogeneity and dynamic shear localizationOsovski, S.; Rittel, D. · Applied Physics Letters · 2012
Quantum-secured imagingMalik, Mehul; Magaña-Loaiza, Omar S.; Boyd, Robert W. · Applied Physics Letters · 2012
Graphene-based ferromagnetic superconductorsVahid Hosseini, Mir; Zareyan, Malek · Applied Physics Letters · 2012
Dual electrode cantilevers for ohmic microscopyIgnatowitz, Markus; Oesterschulze, Egbert · Applied Physics Letters · 2012
Superradiant Raman laser magnetometerWeiner, Joshua M.; Cox, Kevin C.; Bohnet, Justin G.; Chen, Zilong; Thompson, James K. · Applied Physics Letters · 2012
Yb3+Er3+ GLASS LASERSnitzer, E.; Woodcock, R. · Applied Physics Letters · 1965