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[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Microstructure and thermal properties of phase change (GeSbSn)<inf>100-x</inf>Co<inf>x</inf> optical recording films

[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Microstructure and thermal properties of phase change (GeSbSn)100-xCox optical recording films

Sin-Liang Ou, ; Po-Cheng Kuo, ; Shih-Hsien Ma, ; Chih-Long Shen, ; Wei-Tai Tang, ; Don-Yau Chiang, ; Chao-Te Lee,
  • 作者Sin-Liang Ou, ; Po-Cheng Kuo, ; Shih-Hsien Ma, ; Chih-Long Shen, ; Wei-Tai Tang, ; Don-Yau Chiang, ; Chao-Te Lee,
  • 文件大小184.65KB
  • 发表时间2010
  • DOI10.1109/inec.2010.5424938
  • 页码1216-1217
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