[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - In situ electrical property characterization of individual nanostructures using a sliding probe inside a transmission electron microscope
- 作者Fan, Zheng; Tao, Xinyong; Li, Yiping; Yang, Yingchao; Du, Jun; Zhang, Wenkui; Huang, Hui; Gan, Yongping; Li, Xiaodong; Dong, Lixin
- 文件大小1540.62KB
- 发表时间2010
- DOI10.1109/nmdc.2010.5652591
- 页码149-152
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