[IEEE 2010 33rd International Spring Seminar on Electronics Technology (ISSE) - Warsaw, Poland (2010.05.12-2010.05.16)] 33rd International Spring Seminar on Electronics Technology, ISSE 2010 - Evaluation of tin whisker growth
- 作者Jiri, Podzemsky; Martin, Copjan; Jan, Urbanek; Karel, Dusek
- 文件大小755.04KB
- 发表时间2010
- DOI10.1109/isse.2010.5547281
- 页码179-182
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