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[IEEE 2010 10th IEEE International Conference on Solid Dielectrics (ICSD) - Potsdam, Germany (2010.07.4-2010.07.9)] 2010 10th IEEE International Conference on Solid Dielectrics - Electrical extractions of 1-D doping profiles and effective mobility in MOSFET

[IEEE 2010 10th IEEE International Conference on Solid Dielectrics (ICSD) - Potsdam, Germany (2010.07.4-2010.07.9)] 2010 10th IEEE International Conference on Solid Dielectrics - Electrical extractions of 1-D doping profiles and effective mobility in MOSFET

Park, Hyunho; Choi, Byoungdeok
  • 作者Park, Hyunho; Choi, Byoungdeok
  • 文件大小135.39KB
  • 发表时间2010
  • DOI10.1109/icsd.2010.5568045
  • 页码1-3
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