[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Degradation of p-channel power VDMOSFETs under pulsed NBT stress

Djoric-Veljkovic, S.; Dankovic, D.; Prijic, A.; Manic, I.; Davidovic, V.; Golubovic, S.; Prijic, Z.; Stojadinovic, N.

作者Djoric-Veljkovic, S.; Dankovic, D.; Prijic, A.; Manic, I.; Davidovic, V.; Golubovic, S.; Prijic, Z.; Stojadinovic, N.
文件大小258.63KB
发表时间2010
DOI10.1109/miel.2010.5490448
页码443-446

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