[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A new method for estimating spectral performance of ADC from INL
Duan, Jingbo; Jin, Le; Chen, Degang
- 作者Duan, Jingbo; Jin, Le; Chen, Degang
- 文件大小274.44KB
- 发表时间2010
- DOI10.1109/test.2010.5699273
- 页码1-10