Devices’ optimization against hot-carrier degradation in high voltage pLEDMOS transistor
- 作者Hong Wu; Qinsong Qian; Siyang Liu; Weifeng Sun; Longxing Shi
- 卷第50卷
- 期第8期
- 印刷ISSN0026-2714
- 文件大小682.83KB
- 发表时间2010
- DOI10.1016/j.microrel.2010.04.009
- 页码1071-1076
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