ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - (Invited) Performance and Reliability of a 25Gb/s Ge Waveguide Photodetector Integrated in a CMOS Process
- 作者Sahni, Subal; Song, Dan; Sharp, Michael; Kucharski, Daniel; Guckenberger, Drew; Masini, Gianlorenzo
- 印刷ISSN1938-5862
- 文件大小340.88KB
- 发表时间2010
- DOI10.1149/1.3487604
- 页码741-747
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