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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Random Telegraph Noise characterization of p-type silicon nanowire FinFETs

[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Random Telegraph Noise characterization of p-type silicon nanowire FinFETs

Mukherjee, C.; Maiti, T. K.; Maiti, C. K.
  • 作者Mukherjee, C.; Maiti, T. K.; Maiti, C. K.
  • 文件大小461.89KB
  • 发表时间2010
  • DOI10.1109/miel.2010.5490445
  • 页码447-450
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