[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Random Telegraph Noise characterization of p-type silicon nanowire FinFETs
Mukherjee, C.; Maiti, T. K.; Maiti, C. K.
- 作者Mukherjee, C.; Maiti, T. K.; Maiti, C. K.
- 文件大小461.89KB
- 发表时间2010
- DOI10.1109/miel.2010.5490445
- 页码447-450