[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - Customizing pattern set for test power reduction via improved X-identification and reordering
- 作者Kumar, S. Krishna; Kaundinya, S.; Kundu, Subhadip; Chattopadhyay, Santanu
- 文件大小464.13KB
- 发表时间2010
- DOI10.1145/1840845.1840881