Science not yet without bordersSeligson, Joel; Friedman, Victor J. · Physics Today · 2008

Buried diffraction gratings: a phenomenological theorySeligson, Joel; Baumeister, Philip · ao/18/5/ao-18-5-742.pdf · 1979

Modeling of a focusing grating coupler using vector scattering theorySeligson, Joel · ao/27/4/ao-27-4-684.pdf · 1988

Absorber-induced features in the ac response of a He-Ne laserJoel Seligson; Rainer Salomaa; Stig Stenholm · 1976

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Overlay mark performance: a simulation studyFrommer, Aviv; Silver, Richard M.; Seligson, Joel L. · 2005

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Target noise in overlay metrologySeligson, Joel L.; Silver, Richard M.; Adel, Mike E.; Izikson, Pavel; Levinski, Vladimir; Yaffe, Dan · 2004

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - <title>Overlay metrology simulations: analytical and experimental validations</title>Seligson, Joel L.; Golovanevsky, Boris; Poplawski, Jorge M.; Adel, Michael E.; Silver, Richard M.; Herr, Daniel J. · 2003