SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Effect of temperature on the growth of vanadium oxide films deposited by DC reactive magnetron sputtering
Du, Mingjun; Wu, Zhiming; Luo, Zhenfei; Xu, Xiangdong; Yu, Junsheng; Jiang, Yadong; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng
- 作者Du, Mingjun; Wu, Zhiming; Luo, Zhenfei; Xu, Xiangdong; Yu, Junsheng; Jiang, Yadong; Jiang, Ya-Dong; Kippelen, Bernard; Yu, Junsheng
- 卷第7658卷
- 印刷ISSN0277-786X
- 文件大小1051.43KB
- 发表时间2010
- DOI10.1117/12.865558