SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Radar Sensor Technology XIV - The Rayleigh problem is everywhere!
Gray, John E.; Addison, Stephen R.; Ranney, Kenneth I.; Doerry, Armin W.
- 作者Gray, John E.; Addison, Stephen R.; Ranney, Kenneth I.; Doerry, Armin W.
- 卷第7669卷
- 印刷ISSN0277-786X
- 文件大小552.11KB
- 发表时间2010
- DOI10.1117/12.850670