Transmission Electron Microscopy Study of Defects in Nanopyramidal InGaN LEDs Structures
Zakharov, DN; Colby, R; Wildeson, IH; Ewoldt, DA; Liang, Z; Zaluzec, NJ; Garcia, RE; Sands, THD; Stach, EA
- 期刊名称Microscopy and Microanalysis
- 作者Zakharov, DN; Colby, R; Wildeson, IH; Ewoldt, DA; Liang, Z; Zaluzec, NJ; Garcia, RE; Sands, THD; Stach, EA
- 卷第16卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小1628.08KB
- 发表时间2010-7
- DOI10.1017/s1431927610056709
- 页码1508-1509