Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction
- 期刊名称Microscopy and Microanalysis
- 作者Nowell, MM; Carpenter, JO; Wright, SI
- 卷第16卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小731.72KB
- 发表时间2010-7
- DOI10.1017/s1431927610058253
- 页码1352-1353
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