Absolute Strain at the Nanoscale from HREM Images
- 期刊名称Microscopy and Microanalysis
- 作者Johnson, CL; Snoeck, E; Hÿtch, MJ
- 卷第16卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小798.23KB
- 发表时间2010-7
- DOI10.1017/s1431927610059210
- 页码1782-1783
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