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Atomic Structure of Ultra-Thin WSe2 Films Based on HRTEM Analysis

Rouvimov, S; Plachinda, P; Beekman, M; Nguyen, NT; Johnson, D; Moeck, P; Rauch, EF

期刊名称Microscopy and Microanalysis
作者Rouvimov, S; Plachinda, P; Beekman, M; Nguyen, NT; Johnson, D; Moeck, P; Rauch, EF
卷第16卷
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小1086.57KB
发表时间2010-7
DOI10.1017/s1431927610061982
页码1348-1349