SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Stray radiation research in CSRS
Du, Baolin; Yang, Li; Namba, Yoshiharu; Li, Lin; Huang, Yifan; Walker, David D.; Li, Shengyi; Han, Xing; Ma, Bin
- 作者Du, Baolin; Yang, Li; Namba, Yoshiharu; Li, Lin; Huang, Yifan; Walker, David D.; Li, Shengyi; Han, Xing; Ma, Bin
- 卷第7655卷
- 印刷ISSN0277-786X
- 文件大小377.88KB
- 发表时间2010
- DOI10.1117/12.865231