Boron induced charge traps near the interface of Si/SiO2 probed by second harmonic generation
- 作者Heungman Park; Jingbo Qi; Ying Xu; Kalman Varga; Sharon M. Weiss; Bridget R. Rogers; Gunter Lüpke; Norman Tolk
- 卷第247卷
- 期第8期
- 印刷ISSN0370-1972
- 电子ISSN1521-3951
- 文件大小564.36KB
- 发表时间2010
- DOI10.1002/pssb.200983956
- 页码1997-2001
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