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Application of 80-200 kV aberration corrected dedicated STEM with cold FEG

Application of 80-200 kV aberration corrected dedicated STEM with cold FEG

Konno, M; Suzuki, Y; Inada, H; Nakamura, K

期刊名称Journal of Physics: Conference Series
作者Konno, M; Suzuki, Y; Inada, H; Nakamura, K
卷第241卷
电子ISSN1742-6596
文件大小1175.68KB
发表时间2010-07-01
DOI10.1088/1742-6596/241/1/012011

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