SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Intelligent Robots and Computer Vision XXVII: Algorithms and Techniques - N-dimension closeness measurements used in dynamic pattern recognitions
Hu, Chialun John; Casasent, David P.; Hall, Ernest L.; Röning, Juha
- 作者Hu, Chialun John; Casasent, David P.; Hall, Ernest L.; Röning, Juha
- 卷第7539卷
- 印刷ISSN0277-786X
- 文件大小409.43KB
- 发表时间2010
- DOI10.1117/12.837107