SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration of a phase-based 3D imaging system based on uneven fringe projection technique
Zhang, Zonghua; Harding, Kevin; Huang, Peisen S.; Ma, Haiyan; Feng, Hui; Yoshizawa, Toru; Jing, Zhao; Guo, Tong; Zhang, Sixiang
- 作者Zhang, Zonghua; Harding, Kevin; Huang, Peisen S.; Ma, Haiyan; Feng, Hui; Yoshizawa, Toru; Jing, Zhao; Guo, Tong; Zhang, Sixiang
- 卷第7855卷
- 印刷ISSN0277-786X
- 文件大小1147.25KB
- 发表时间2010
- DOI10.1117/12.868768