Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros; Bultreys, Daniel; Rouvimov, Sergei; Moeck, Peter
- 期刊名称Zeitschrift für Kristallographie
- 作者Rauch, Edgar F.; Portillo, Joaquin; Nicolopoulos, Stavros; Bultreys, Daniel; Rouvimov, Sergei; Moeck, Peter
- 卷第225卷
- 印刷ISSN0044-2968
- 文件大小182.43KB
- 发表时间2010-01
- DOI10.1524/zkri.2010.1205