Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology
- 期刊名称IEICE Transactions on Information and Systems
- 作者HAN, Young-Shin; KIM, SoYoung; KIM, TaeKyu; JUNG, Jason J.
- 期第7期
- 印刷ISSN0916-8532
- 电子ISSN1745-1361
- 文件大小349.28KB
- 发表时间2010
- DOI10.1587/transinf.E93.D.2001
- 页码2001-2004
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