Dislocation Reduction of HgCdTe/Si ThroughEx
G. Brill; S. Farrell; Y. P. Chen; P. S. Wijewarnasuriya; Mulpuri V. Rao; J. D. Benson; N. Dhar
- 作者G. Brill; S. Farrell; Y. P. Chen; P. S. Wijewarnasuriya; Mulpuri V. Rao; J. D. Benson; N. Dhar
- 卷第39卷
- 期第7期
- 印刷ISSN0361-5235
- 电子ISSN1543-186X
- 文件大小1217.82KB
- 发表时间2010-07
- DOI10.1007/s11664-010-1142-3
- 页码967-973